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Localized micromagnetic perturbation of domain walls in magnetite using a magnetic force microscope.
S. Foss, R. Proksch, E. D. Dahlberg, B. Moskowitz, B. Walsh
Appl. Phys. Lett. 69 p. 3426 (1996).
Abstract: Magnetic force microscope (MFM) profiles of domain walls (DWs) in magnetite were measured using commercially available MFM tips. Opposite polarity profiles of a single DW segment were obtained by magnetizing the MFM tip in opposite directions perpendicular to the sample surface. During a measurement, the field of the tip locally magnetized the DW, resulting in a more attractive tip-sample interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip. (31 References).
last modified:
10.Jun.2002
by Thomas Gredig